A Spur-free Dynamic Element Matching Scheme for Bandpass DACs

Dynamic element matching (DEM) is a popular class of techniques that exploit redundancy to linearize digital-to-analog converters (DACs) in the presence of component mismatches. Most DEM techniques employ spectral shaping of the DAC mismatch error power, often in conjunction with randomization, to suppress in-band error and spurious tones. However, spurious tone elimination is mathematically guaranteed in very few DEM approaches that too only in 1st order high-pass shaping DEM. This paper describes a “reset-and-dither DEM” technique, that can provably eliminate spurious tones in oversampled band-pass DACs in the presence of static component mismatches. The theoretical basis of the technique is outlined and the absence of spurious tones is demonstrated through simulations.