Built-in self-test (BIST) design of large-scale analog circuit networks

The decomposition approach has been successfully applied to fault diagnosis and fault prediction of large-scale analog circuit networks. However, as the number of accessories nodes required for locating faults at the desired level of decomposition increases, it is difficult to provide proportionally more I/O (input/output) connections. A built-in self-test (BIST) structure is presented to increase the number of accessible nodes and still keep a low pin overhead.<>