Dye-sensitized solar cell testing by an improved resistive load method topology with Raspberry Pi: A cost-effective novel approach

This paper presents detailed testing of a dye-sensitized solar panel (DSSP) for parameter extraction of the current-voltage (I-V) curve. Widespread application of soft-computing techniques increases nowadays, including in photovoltaic areas. The equivalent circuit model enhances the research possibilities with soft computing techniques. The parameter extraction from photovoltaic is necessary for the modeling. Here, the experimental setup utilizes potentiometer-based resistive load with raspberry pi model 4B. The complete design includes an LCD monitor, solar power meter, current, voltage, and temperature sensor. The I-V curve tracing for a single DSSP would be reliable with this work. This study is free from the effect of high-frequency switching loss.