Co-optimization of dynamic/static test power in scan test

Low-power design has become a challenge of test. We propose an effective low-power scan architecture named PowerSluice to minimize power consumption during scan test, which is based on scan chain modifications. On one hand, a kind of blocking logic is inserted into the scan chain to reduce the dynamic power and two kinds of controlling units are also inserted to decrease the leakage power during the shift cycle. On the other hand, using genetic algorithm, the exact values of control signals are found out to control the process. Experiments results indicate that this architecture can effectually reduce power during scan test with probably minimum area cost.