A Novel Parallel-Plate Dielectric Resonator Method for Broadband Complex Permittivity Measurement in the Millimeter-Wave Bands

This article proposes a novel measurement method based on parallel-plate dielectric resonator (PPDR) for determining complex permittivity of low-loss dielectric materials over a wide frequency range. Two 1.0-mm coaxial probes are placed symmetrically as a coupling structure in the center of top and bottom of the PPDR, and only the TM0np resonant modes will be selectively excited. For each value of
$p$
, the resonator will operate over a specific frequency range, within which there are usually multiple frequency points available for testing. Based on this unique feature, dielectric constants of cylindrical or disk-shaped samples can be measured from less than 20 up to 110 GHz by utilizing TM0np high-order modes. Rigorous analysis of the PPDR based on the electromagnetic field matching method is carried out and verified numerically. Moreover, the PPDR method is further validated experimentally by measuring several specimens processed from well-known materials, the main sources of measurement uncertainty are also analyzed in detail, and some recommendations are made accordingly. The results show that the PPDR method can perform high-accuracy measurement of complex permittivity in the millimeter-wave bands, even when the sample thickness exceeds the maximum value limited by the current state of the art.