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IEEE Transactions on Reliability

Issue 5 • Dec. 1978

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Displaying Results 1 - 25 of 56
  • [Front cover]

    Publication Year: 1978, Page(s): c1
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    Freely Available from IEEE
  • IEEE Reliability Group

    Publication Year: 1978, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1978
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    Freely Available from IEEE
  • Inclusion and Exclusion

    Publication Year: 1978, Page(s): 305
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  • Bayes vs. Whim

    Publication Year: 1978, Page(s): 305
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  • A Reliability Growth Model

    Publication Year: 1978, Page(s):306 - 307
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (304 KB)

    A system can be in one of two states: perfect (s0) or imperfect (s1). At any trial, the system can succeed or fail if it is in s1, but will never fail if in s0. After every failure, some corrective action is taken which, with a chance ¿, will lead to a transition to s0. Even if the corrective action does not succeed, i.e. the system is still in s1, the probability of failure reduces by a constant... View full abstract»

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  • Book Reviews

    Publication Year: 1978, Page(s): 307
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  • A Confidence Interval for the Barlow-Scheuer Reliability Growth Model

    Publication Year: 1978, Page(s):308 - 310
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (575 KB)

    Barlow & Scheuer proposed a useful scheme for estimating reliability growth of a system undergoing developmental testing and offered a conservative lower s-confidence bound. This paper shows how a less conservative lower s-confidence bound can be found by using an equivalent model for system reliability. View full abstract»

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  • Book Reviews

    Publication Year: 1978, Page(s): 310
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  • Multiobjective Optimization by the Surrogate Worth Trade-off Method

    Publication Year: 1978, Page(s):311 - 314
    Cited by:  Papers (32)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (706 KB)

    This paper applies the Surrogate Worth Trade-off method to multiobjective reliability-allocation problems. A multiobjective mathematical model is formulated and the problem is to assign reliability to each stage of a series system such that system reliability is maximized and cost is minimized, subject to multiple constraints. The preferred solution of the decision-maker is obtained by using the S... View full abstract»

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  • Abstracts of reliability doctoral dissertations

    Publication Year: 1978, Page(s): 314
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  • Reliability Optimization In The Design Of Telephone Networks

    Publication Year: 1978, Page(s):315 - 319
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (712 KB)

    Telephone network reliability is defined as the degree of complying with subscribers expectations: the probability to have a given number of ready-to-use telephone channels between terminals. A model is presented for the cost minimization of an isolated telephone link, over capacity and channel reliability subject to reliability constraints. The optimization, achieved by Lagrange multipliers, resu... View full abstract»

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  • Abstracts of reliability doctoral dissertations

    Publication Year: 1978, Page(s): 319
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  • A Note on Heuristic Methods in Optimal System Reliability

    Publication Year: 1978, Page(s):320 - 324
    Cited by:  Papers (49)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (791 KB)

    Many optimization techniques have been used to solve redundancy allocation problems, most of which result in noninteger solutions. A few, including dynamic programming and integer programming, as well as a host of heuristic methods give integer solutions. This note critically reviews six promising heuristic approaches. The advantages and disadvantages of each of the approaches are discussed. An ex... View full abstract»

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  • Book Reviews

    Publication Year: 1978, Page(s): 324
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  • An Improved Algorithm for Reliability Optimization

    Publication Year: 1978, Page(s):325 - 328
    Cited by:  Papers (33)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (652 KB)

    This paper proposes a modification of the Aggarwal et al. algorithm for reliability optimization by introducing a new heuristic criterion for selecting the subsystem where redundancy is to be added. This criterion accounts for the relative decrement in unreliability versus the largest of the relative increments in resources. The method applies to multiple separable constraint problems (which need ... View full abstract»

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  • Abstracts of reliability doctoral dissertations

    Publication Year: 1978, Page(s): 328
    Request permission for commercial reuse | PDF file iconPDF (218 KB)
    Freely Available from IEEE
  • Estimation of Reliability from Multiple Independent Grouped Censored Samples with Failure Times Known

    Publication Year: 1978, Page(s):329 - 331
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (408 KB)

    Failure times of one type aircraft-engine component were recorded. In addition, life times are periodically recorded for unfailed engine components. The data are considered as multiple s-independent grouped censored samples with failure times known. The assumed failure model is the 2-parameter Weibull distribution. Maximum likelihood estimates are derived. The exponential model is used for compari... View full abstract»

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  • Manuscripts Received

    Publication Year: 1978, Page(s): 331
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  • Empirical Bayes Estimators of Reliability for Lognormal Failure Model

    Publication Year: 1978, Page(s):332 - 336
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (906 KB)

    Empirical Bayes (EB) procedures are considered for estimating the reliability R(t;¿,¿) = gaufc[(ln t -¿)/¿] for the lognormal failure model. EB estimators are obtained for the 2 cases: i)¿ is unknown and ¿ is known, and both ¿ and ¿ are unknown. The empirical Cdf of the maximum likelihood estimators of the parameters is used to obtain the EB estimators. ii) A smooth EB estimator of R(t;¿,... View full abstract»

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  • Manuscripts Received

    Publication Year: 1978, Page(s): 336
    Request permission for commercial reuse | PDF file iconPDF (193 KB)
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  • Eigenvalue Approach for Computing the Reliability of Markov Systems

    Publication Year: 1978, Page(s):337 - 340
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (583 KB)

    This paper solves the computation of the reliability of Markov systems. The solution is especially useful for systems where the number of states is large. Not only is the mean time-to-failure computed but an analytic expression is given for the probability of the system's being in a certain state as a function of time. The solution is derived by solving the eigenvalues and eigenvectors of the tran... View full abstract»

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  • Free proceedings

    Publication Year: 1978, Page(s): 340
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  • Comments on "A Method for Calculation of Network Reliability

    Publication Year: 1978, Page(s): 341
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (124 KB)

    The efficiency of the algorithm can be improved by changing one of the steps. View full abstract»

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  • A Decomposition Method for Computing System Reliability by a Matrix Expression

    Publication Year: 1978, Page(s):342 - 344
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (401 KB)

    A decomposition method using a matrix representation for computing the reliability of a redundant system is proposed. The system is decomposed into two subsystems according to up- and down- states of a keystone element. This is repeated recursively until all subsystems have known reliability. The criterion for choosing the keystone element and an algorithm for decomposing a system are described. View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu