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IEEE Instrumentation & Measurement Magazine

Issue 4 • August 2007

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  • Front cover - IEEE Instrumentation and Measurement Magazine

    Publication Year: 2007, Page(s):c1 - c4
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  • From the Editor's Bench

    Publication Year: 2007, Page(s): 4
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  • [Advertisement]

    Publication Year: 2007
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  • Welcome To Autotestcon

    Publication Year: 2007, Page(s): 6
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  • IEEE I&M Society Technical Committee listing

    Publication Year: 2007, Page(s): 8
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  • Prognostics for Combat Systems of the Future

    Publication Year: 2007, Page(s):10 - 14
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (505 KB) | HTML iconHTML

    Maintenance and repair of weapons systems is an ever-increasing part of the total cost. The time to repair faults can also have a major impact on system availability. Prediction of faults before they occur allows removal of potentially faulty units or the pre-positioning of spares to allow quick repairs at minimal cost. Many new weapon system procurements include requirements to predict failures i... View full abstract»

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  • STTE/EF-2000 Typhoon New Generation of Automatic Test Bench (STTEs) For Eurofi ghter's Avionic Units

    Publication Year: 2007, Page(s):15 - 19
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (407 KB) | HTML iconHTML

    The STTEs (special to type test equipment) are specific automatic test benches designed to perform HW/SW (hardware/software co-design) integration tasks, acceptance test procedure protocols and validation of production processes of avionic units for the Eurofighter Aircraft Indra Systems, Inc., a Spanish information technologies company, has designed a new generation of low cost STTEs based on the... View full abstract»

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  • Electronic Prognostics - A Case Study Using Switched-Mode Power Supplies (SMPS)

    Publication Year: 2007, Page(s):20 - 26
    Cited by:  Papers (3)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1332 KB) | HTML iconHTML

    This paper describes the process, used to develop prognostics algorithms for a commercially available switched-mode power supply (SMPS) using corroborative evidence sources. The process begins with a Pareto analysis indicating the primary modes of failure. Critical components are identified using a three-tier failure mode and effects analysis (FMEA) by investigating device, circuit, and system par... View full abstract»

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  • Performance Based Test - Example of Universal RF Tester with Built-In Automated Diagnostics and Automated Probing for Manufacturing and Depot Level Testing

    Publication Year: 2007, Page(s):27 - 31
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (400 KB) | HTML iconHTML

    This paper explores the strategy and processes used to simplify the specification, data and implementation of combining functional tests for multiple lowest replaceable units (LRUs) on a single tester at a cost and complexity the same as that of a similar single unit product tester. It shows that developing test strategies during the preliminary and detailed design reviews, companies can address m... View full abstract»

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  • In-Situ, Real-Time Detector for Faults in Solder Joint Networks of Operational, Fully-Programmed Field Programmable Gate Arrays (FPGAs)

    Publication Year: 2007, Page(s):32 - 37
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (623 KB) | HTML iconHTML

    Introduced is an innovative, in-situ solder-joint built-in self-test (SJ BISTtrade) to detect high-resistance damage to solder-joint networks of fully operational field programmable gate arrays (FPGAs) in ball-grid array (BGA) packages such as a XILINXreg FG1152/FG1156. FPGAs are used in all manner and kinds of control systems in both defense and commercial applications. View full abstract»

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  • Applying CMMI and Strategy to ATE Development

    Publication Year: 2007, Page(s):38 - 43
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (418 KB) | HTML iconHTML

    Focusing on the unique perspectives of "test" provides insights that may be lost in the details of the other disciplines. It is not a breakthrough in technology or the invention of new testing techniques that will make the difference for most organizations, instead it will be "seeing the forest through the trees" that will provide the needed insights for improvements. Alignment of the testing pers... View full abstract»

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  • Finite Arithmetic Considerations for the FFT Implemented in FPGA-Based Embedded Processors in Synthetic Instruments

    Publication Year: 2007, Page(s):44 - 49
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (791 KB) | HTML iconHTML

    An important trend in the synthetic instrument community is the development of products around the capabilities of field programmable gate array (FPGA) based embedded processors. It is assumed here that signals arrive at the FPGA input at high data rates, low to medium data bit width, and low to medium signal-to-noise ratio. As a consequence of the processing that reduces signal bandwidth, the dat... View full abstract»

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  • IEEE IMTC 2007 in Warsaw, Poland

    Publication Year: 2007
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  • I2MTC - International Instrumentation & Measurement Technology Conference 2008 - Call for Papers

    Publication Year: 2007
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  • advertisement - minicircuits.com

    Publication Year: 2007
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  • Letter to the Editor

    Publication Year: 2007, Page(s): 53
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  • 2006 Instrumentation and Measurement Society Awards

    Publication Year: 2007, Page(s): 61
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  • newproducts

    Publication Year: 2007, Page(s):54 - 60
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  • Autotestcon 2008 Call For Papers

    Publication Year: 2007
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  • calendar

    Publication Year: 2007, Page(s): 63
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Aims & Scope

The magazine is a bimonthly publication.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Prof. Wendy Van Moer

wendy.w.vanmoer@ieee.org
IandMMagazineEIC@ieee.org