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IEEE Transactions on Reliability

Issue 2 • June 1989

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Displaying Results 1 - 18 of 18
  • Comment on: the mean value of the W/sub u/ statistic

    Publication Year: 1989, Page(s):212 - 213
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (166 KB)

    In a test to identify the uniform distribution, S.W. Cheng and F.A. Spiring (IEEE Trans. Reliability, vol. R-36, p.98, Apr. 1987) develop some theoretical results associated with the W/sub u/ test statistic. The central values obtained by their formula do not fit the quantiles of W/sub u/. The present authors derive three approximations for finding the mean value of W/sub u/ and compare the result... View full abstract»

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  • Comments on "Control-limits of QC charts for skewed distributions using weighted-variance

    Publication Year: 1989
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (119 KB)

    The commenter offers three criticisms of the suggested weighted variance (WV) method in the paper by Choobineh and Ballard (ibid., vol.R-36, p.473-7, Oct. 1987), although agreeing that the method, which introduces different factors for the upper and lower control limit in the case of a skewed distribution, is generally simple and sensible. He contends that: (1) the WV method does not use the same ... View full abstract»

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  • Analysis for mission reliability of a combat tank

    Publication Year: 1989, Page(s):242 - 245
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (228 KB)

    Mission reliability is the probability that a system will perform its specified mission. In a reliability sense, some subsystems or components are not required to operate perfectly for a certain mission, and sometimes it is not reasonable to assume that the states of all components are statistically independent. The purpose of this study is to set up mathematical models for the moving and firing m... View full abstract»

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  • Practical considerations in developing an instrument-maintenance plan

    Publication Year: 1989, Page(s):253 - 264
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1120 KB)

    The author develops a general set of considerations to explain how a consistent, well-organized, prioritized, and adequate time-allowance program plan for routine maintenance can be constructed. The analysis is supplemented with experience from the high flux isotope reactor (HFIR) at US Oak Ridge National Laboratory (ORNL). After the preventive maintenance (PM) problem was defined, the instruments... View full abstract»

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  • Direct evaluation of fault trees using object-oriented programming techniques

    Publication Year: 1989, Page(s):186 - 192
    Cited by:  Papers (17)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (568 KB)

    Object-oriented programming techniques are used in an algorithm for the direct evaluation of fault trees. The algorithm combines a simple bottom-up procedure for trees without repeated events with a top-down recursive procedure for trees with repeated events. The object-oriented approach results in a dynamic modularization of the tree at each step in the reduction process. The algorithm reduces th... View full abstract»

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  • Finding modules in fault trees

    Publication Year: 1989, Page(s):165 - 176
    Cited by:  Papers (31)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (672 KB)

    A new method for identifying all possible modules is presented. There are two kinds of modules: (1) those whose output events are expressed by gate events, and (2) those whose output events are not expressed by gate events. The latter are logical OR or AND combinations of basic events and modules. The method requires as input only fault-tree structure data representing gate event output-input rela... View full abstract»

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  • Bayes estimation of reliability under a random environment governed by a Dirichlet prior

    Publication Year: 1989, Page(s):218 - 223
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (388 KB)

    The reliability function of a component whose lifetime is exponentially distributed with a known parameter λ>0 is R (t|λ)=exp (-λt). If an environmental effect multiplies the parameter by a positive factor η, then the reliability function becomes R(t|η,λ)=exp(-ηλt). The authors assume that η... View full abstract»

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  • A replacement policy maximizing MTTF of a system with several spare units

    Publication Year: 1989, Page(s):210 - 211
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (128 KB)

    A replacement policy is considered that maximizes mean time-to-failure (MTTF) of a system with N spare units. The optimum replacement time of a system with k spares (k=1, 2, ..., N) is derived successively from MTTF with k-1 spares by induction. The maximum MTTF is approximately given by a reciprocal of the hazard rate View full abstract»

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  • Modeling dependent failures for the availability of extra high voltage transmission lines

    Publication Year: 1989, Page(s):236 - 241
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (380 KB)

    An investigation is conducted into the calculation of availability for parallel transmission lines (two or more) in the same tower or on the same right of way. As in many studies, the development of mathematical models is an important step. The models are justified using historical data and known characteristics of power system elements. A statistical method is used to generalize the failure rate ... View full abstract»

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  • Unification of reliability/availability/repairability models for Markov systems

    Publication Year: 1989, Page(s):246 - 252
    Cited by:  Papers (19)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (476 KB)

    An examination is made of the structure of the general transition rate matrix from which the model transition rate matrices are obtained. An exact solution to the system-state equations is derived which depends on the eigenvalues of the model transition rate matrix. In order to obtain the exact numerical solution, an algorithm is given which requires a minimal amount of computer storage requiremen... View full abstract»

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  • Burn-in optimization under reliability and capacity restrictions

    Publication Year: 1989, Page(s):193 - 198
    Cited by:  Papers (18)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (444 KB)

    Burn-in is a method to screen out early failures of electronic components. The burn-in problems that minimize the system life-cycle cost have been investigated reasonably well in many applications, but physical constraints during the decision process have not been considered. The authors search for optimal burn-in time and develop a cost-optimization model. Two types of constraint are to be satisf... View full abstract»

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  • Fault trees and imperfect coverage

    Publication Year: 1989, Page(s):177 - 185
    Cited by:  Papers (37)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (700 KB)

    A new algorithm is presented for solving the fault tree. The algorithm includes the dynamic behavior of the fault/error handling model but obviates the need for the Markov chain solution. As the state space is expanded in a breadth-first search (the same is done in the conversion to a Markov chain), the state's contribution to each future state is calculated exactly. A dynamic state truncation tec... View full abstract»

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  • Robustness and precision of parametric and distribution-free tolerance limits for two lifetime distributions

    Publication Year: 1989, Page(s):224 - 228
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (404 KB)

    Exact parametric tolerance limits or confidence limits on reliability are not available for the gamma distribution, and it is difficult to determine the approximate methods which are accurate for all parameter values. The precision lost by using the distribution-free tolerance-limit method based on the first order statistic, compared to using an approximate gamma tolerance limit method, is studied... View full abstract»

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  • Component-placement optimization for convectively cooled electronics

    Publication Year: 1989, Page(s):199 - 205
    Cited by:  Papers (21)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (564 KB)

    A discussion is presented of the optimum positioning of a sequence of convectively cooled electronic devices in order to reduce failures due to thermal factors. A set of equations is developed for optimizing the positioning of the devices. This problem is analogous to the classical operations research problem of the optimum time scheduling of several jobs on a single machine, where for each job th... View full abstract»

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  • Reliability of consecutive-k-out-of-n:F systems with nonidentical component reliabilities

    Publication Year: 1989, Page(s):229 - 233
    Cited by:  Papers (12)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (292 KB)

    A system with n components in sequence is a consecutive- k-out-of-n:F system if it fails whenever k consecutive components are failed. Under the supposition that component failures need not be independent and that component failure probabilities need not be equal, a topological formula is presented for the exact system reliability of linear and circular consecut... View full abstract»

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  • How to define system improvement and deterioration for a repairable system

    Publication Year: 1989, Page(s):214 - 217
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (240 KB)

    The problem of how to define system improvement and deterioration for a repairable system has long been of interest to those who are engaged in reliability analysis. A model-free definition of system behavior is provided. Various properties of the definition are studied. A new model is proposed for a repairable system View full abstract»

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  • Component vs. system burn-in techniques for electronic equipment

    Publication Year: 1989, Page(s):206 - 209
    Cited by:  Papers (17)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (264 KB)

    Simulation can be used to determine the effects of different combinations of in-process and system burn-in times. It is shown that optimal burn-in at each stage of component assembly is not always optimal for the final system. Simulation is used to evaluate a nonrepairable system and provides individual component burn-in times that optimize the mean residual life of the assembled system View full abstract»

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  • An efficient non-recursive algorithm for computing the reliability of k-out-of-n systems

    Publication Year: 1989, Page(s):234 - 235
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (148 KB)

    An algorithm for computing the reliability of k-out-of- n systems is proposed. It is simple, easy to implement on a computer, time and memory efficient, and good for numerical computation. The memory complexity is O(n-k), and for a given value of n-k the computation time is proportional to n . Its FORTRAN implementation is presented View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu