By Topic

Ninth IEEE/CHMT International Symposium on Electronic Manufacturing Technology,Competitive Manufacturing for the Next Decade

12-17 Feb. 1989

Filter Results

Displaying Results 1 - 25 of 65
  • Ninth IEEE/CHMT International Electronic Manufacturing Technology Symposium. Competitive Manufacturing for the Next Decade. Proceedings 1990 IEMT Symposium (Cat. No. 90CH2864-7)

    Publication Year: 1990
    Request permission for commercial reuse | PDF file iconPDF (40 KB)
    Freely Available from IEEE
  • CEPT-a computer aided manufacturing application for managing equipment reliability and availability and maintainability in the semiconductor industry

    Publication Year: 1990, Page(s):31 - 40
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (632 KB)

    The need for a comprehensive equipment information management system is crucial for driving high equipment reliability/utilization in manufacturing. The authors describe the features of one such system developed and implemented at Intel's factories. This equipment management system was layered on top of the preexisting shop-floor computer-aided-manufacturing (CAM) system, Workstream. Focus areas o... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The equipment improvement program: a structured methodology for continuous improvement and increased equipment life

    Publication Year: 1990, Page(s):25 - 30
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (440 KB)

    The equipment improvement program, a SEMATECH initiative to help improve the US semiconductor industry's efficient use of capital equipment, is described. This program focuses on continuous performance improvement of existing equipment to meet current and future manufacturing requirements with the goal of extending their useful life by a generation. Working hand-in-hand with suppliers, these progr... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Template approach to design and manufacturing

    Publication Year: 1990, Page(s):23 - 24
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (144 KB)

    A key to successfully managing cost and scheduling while producing high-quality products is the template approach. The assumptions for the template effort are different from most government improvement efforts. First, the template approach recognizes that weapons systems acquisition is an industrial process and not a purchasing process. Secondly, the template advocates believe that both government... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Prospects of the automation for ULSI manufacturing

    Publication Year: 1990, Page(s):19 - 22
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (164 KB)

    The present condition of semiconductor wafer manufacturing line automation and future prospects are described. The wafer manufacturing line includes direct operations such as the setting of processing parameters for the equipment, the inspection of the products, and the transport of wafers between equipment. It also includes indirect operations such as production control, quality control, and equi... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • International cooperation to develop intelligent manufacturing systems (IMS)

    Publication Year: 1990
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (72 KB)

    Summary form only given. The author discusses some aspects of advanced manufacturing and the advantages of international collaboration and suggests some areas for collaboration. He outlines the Japanese intelligent manufacturing system (IMS) proposal and enumerates its background. The IMS proposal includes the following elements: (1) the move away from manufacturing by the work force, (2) the appe... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Experiment design, defect analysis, and results for the wave soldering of small outline integrated circuits

    Publication Year: 1990, Page(s):361 - 365
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (404 KB)

    Experiments were conducted to determine an optimum footprint design for small-outline integrated-circuit (SOIC) surface mount packages that will be wave soldered to the back sides of PC boards. SO-8 SOIC surface mount pad dimensions, relative component positions, and solder mask openings were evaluated to determine a footprint configuration that would reduce solder bridges and solder skips (defect... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Manufacturing electronic equipment in Europe

    Publication Year: 1990
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (88 KB)

    Summary form only given. The author explores the current structure of electronic equipment manufacturers in Europe and speculates on the likely changes that will occur in the industry as the wider political and economic changes work through a large, affluent, electronically developing market. Western Europe consists of 18 nations, 12 of whom will form the European Community and a single market ent... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Improving manufacturing reliability in IC package assembly using FMEA technique

    Publication Year: 1990, Page(s):356 - 360
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (388 KB)

    The author describes the basic potential failure mode and effect analysis (FMEA) technique and shows how the technique is useful in improving the manufacturing reliability and final quality of an IC package, and for complex packages and multichip module assemblies. The use of FMEA for improving the manufacturability and manufacturing reliability of packages by a systematic and quantified analysis ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A rule based flow control plan for management of work-in-process

    Publication Year: 1990, Page(s):270 - 276
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (520 KB)

    The authors describe development of an integrated movement handling and work-in-process management system of an automated storage and retrieval system that is used as the material handling system for a highly automated electronic card assembly line. The line is designed for high-volume assembly of surface mount technology electronic boards. Use of an automated storage and retrieval system for work... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Statistical control of VLSI fabrication processes

    Publication Year: 1990, Page(s):174 - 183
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (840 KB)

    The authors present a formal approach to statistical process control of VLSIC fabrication processes. The system, developed at Carnegie Mellon University (CMU), aims at integrating the design (process and layout), wafer processing, testing, diagnosis, and control into a set of strongly interacting procedures that will aim at maximizing the profit from the fabrication line. The authors describe an i... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Manufacturing information systems and productivity improvement activities

    Publication Year: 1990, Page(s):12 - 16
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (256 KB)

    The author describes the development of a shop floor control systems (SFCSs) over the past decade and also discusses activities aimed at improving productivity through the use of an SFCS. An SFCS has the following functions: database operation, data collection, information services, and manufacturing equipment control and monitoring. Two examples of leading-edge and typical SFCSs in the Japanese e... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Uncertainty management in process planning for PCB assembly

    Publication Year: 1990, Page(s):290 - 296
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (552 KB)

    Computer-aided process planning (CAPP) systems are an ideal application for expert system (ES) techniques in manufacturing. The design of a prototype CAPP system that can deal with the uncertainty that is an integral part of every manufacturing facility is described. The implementation of a nonmonotonic reasoning system (NMRS) and an educated-guess mechanism are discussed. In this case, the exampl... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A process control methodology applied to sub-micron gate lithography in manufacturing GaAs MMICs

    Publication Year: 1990, Page(s):128 - 134
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (672 KB)

    A methodology for guiding the pursuit of process control at Hewlett-Packard's Microwave Technology Division is presented. The output of a given process or subprocess must reach four progressive levels of control. When the output can be reliably measured, it is considered measurable. The second level is reached when this output, viewed in aggregate and over time, is found to be predictable. When th... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Static simulation: a new method of facility automation analysis

    Publication Year: 1990, Page(s):114 - 119
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (640 KB)

    An example of a typical factory is presented in order to compare the requirements and the results of three methods for analyzing manufacturing facilities. While the process of obtaining the data is the same for the different types of modeling, the development of the model is different. The three methods are static modeling (the spreadsheet); dynamic simulation, which solves the requirement for obt... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Automated statistical process control systems (ASPCS)

    Publication Year: 1990, Page(s):204 - 207
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (160 KB)

    Describes eight steps necessary to automate statistical quality control for a manufacturing facility. Successful implementation depends mainly on management support and the talent involved. The benefits of this system include improved productivity and self-sufficiency for the operator. The objective can be achieved through the implementation of automated statistical process control systems (ASPCSs... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Application of mechanical-technology CAD to microelectronic device design and manufacturing

    Publication Year: 1990, Page(s):350 - 355
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (396 KB)

    A computer-aided-design (CAD) architecture for microelectromechanical systems is presented in which conventional mask layout and process simulation tools are linked to three-dimensional mechanical CAD and finite-element tools for analysis and simulation. The architecture is exercised at an elementary level by modeling the first steps of the MIT baseline CMOS process. An architecture for an object-... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Physiochemical stability of copper/polyphenylquinoxaline interfaces

    Publication Year: 1990, Page(s):240 - 246
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (524 KB)

    New results obtained with polyphenylquinoxaline (PPQ)/Cu multilayer structures are presented. Thermal stability at the Cu/polymer and polymer/Cu interfaces during the polymer curing process is very important to preserve good adhesion between the conductor and dielectric materials. The interfacial behavior is studied as a function of annealing temperature and of annealing atmosphere. In the case wh... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • IBM Endicott CIM migration and implementation strategy

    Publication Year: 1990, Page(s):318 - 324
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (568 KB)

    The authors describe the steps required for CIM (computer-integrated-manufacturing) implementation that meet the enterprise objectives. The commitments, organization and process being used to simplify the business processes in support of a CIM environment and the migration of the information systems architecture are also given. At IBM in Endicott, NY, detailed plans have been developed to assure i... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Group technology for high-mix printed circuit assembly

    Publication Year: 1990, Page(s):264 - 269
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (524 KB)

    The authors chronicle the successful application of the greedy board heuristic to the problem of assigning individual printed circuit board assemblies to product cells in a high-mix, capacity-constrained production environment. The specific case presented concerns the design of a high-speed surface mount line. The algorithm requires a list of boards, board volumes, and a bill of materials for each... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Estimating front end throughput: where has all the data gone [PCB manufacture]

    Publication Year: 1990, Page(s):98 - 102
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (396 KB)

    The authors have three objectives. The first is to explain a number of reasons for the unavailability of necessary data for high-fidelity performance modeling for manufacturing. The second objective is to illustrate the importance of matching model detail with data accuracy. The authors provide an example in which an analytical model is compared with simulation for a set of very coarse data and sh... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Design of experiment is the best way to optimize a process at minimal cost

    Publication Year: 1990, Page(s):166 - 173
    Cited by:  Papers (2)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (488 KB)

    The authors deal with offline statistical control techniques which optimize a process and highlight the use of statistically designed experiments. The authors also describe the advantage of offline quality control over an online quality control mechanism. They define a systematic road map to carry out a designed experiment. The design of experiment (DOE) method not only defines the optimum window ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Automatic problem detection and documentation in a plasma etch reactor

    Publication Year: 1990, Page(s):47 - 50
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (300 KB)

    IC manufacturing involves a large number of complex process steps. There is a probability of a microprocessing error in each of these steps. The author describes two software tools, in a single-wafer plasma etcher, that have been developed to minimize the occurrence and maximize the efficiency of the diagnosis of such microprocessing. The first examines the endpoint trace of every wafer and determ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Semiconductor manufacturing in the 21st century: capital investment vs. technological innovation

    Publication Year: 1990, Page(s):3 - 11
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (924 KB)

    The author describes the technological problems which must be solved if the goal of utilizing the dramatic improvements in cost/performance of computer technology to replace manufacturing methods which have become prohibitively expensive is to be realized. Envisioning a manufacturing environment of rapid change (anathema to most manufacturing organizations), three basic components of a futuristic ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • PACE: a floor control system for just-in-time manufacturing

    Publication Year: 1990, Page(s):287 - 289
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (316 KB)

    A system for tracking the flow of work in progress (WIP) through the manufacturing floor is described. The tracking system is based on the double-entry bookkeeping concept and has been designed to require relatively little data entry. It also does not require batch integrity, thus making it ideal for high-volume just-in-time manufacturing. The implementation strategy and experiences with the syste... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.