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1999 IEEE AUTOTESTCON Proceedings (Cat. No.99CH36323)

Aug. 30 1999-Sept. 2 1999

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  • 1999 IEEE AUTOTESTCON Proceedings (Cat. No.99CH36323)

    Publication Year: 1999
    Request permission for commercial reuse | PDF file iconPDF (467 KB)
    Freely Available from IEEE
  • Author index

    Publication Year: 1999, Page(s):829 - 830
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    Freely Available from IEEE
  • Electrocontact microdisplacement testing subsystem

    Publication Year: 1999, Page(s):373 - 376
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (152 KB)

    The subsystem relates to control, testing and measurement instrumentation with closed digital control loop structure. It may be used for testing and measurement of smooth displacements resulting from, for example, force or temperature deformation of an object, or for detection of charges in geometric dimensions of an object while monitoring its airtightness; in particular, when monitoring airtight... View full abstract»

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  • Delivering diagnostic solutions with COTS expert systems; a case study

    Publication Year: 1999, Page(s):367 - 371
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (376 KB)

    More and more organizations are realizing the tremendous cost involved in the maintenance of increasingly complex equipment. Developing diagnostic solutions in-house is highly challenging and very expensive task and the only way to support the development is to re-use tools in many different projects. In recent years, COTS solutions have appeared and proved their mettle in actual use. Serviceabili... View full abstract»

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  • A hidden Markov model based algorithm for online fault diagnosis with partial and imperfect tests

    Publication Year: 1999, Page(s):355 - 366
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (540 KB)

    In this paper, we present a Hidden Markov Model (HMM) based algorithm for online fault diagnosis in complex large-scale systems with partial and imperfect tests. The HMM-based algorithm handles test uncertainties and inaccuracies, finds the best estimate of system states and identifies the dynamic changes in system states, such as from a fault-free state to a faulty one. We also present two method... View full abstract»

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  • Evolving to a single point of access automatic test systems-product group management (ATS-PGM)

    Publication Year: 1999, Page(s):87 - 91
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (284 KB)

    This paper discusses the evolution of processes involved in designing and implementing the `Single Point of Access to Mission Critical Information' for the ATS-PGM web site. The purpose is to discuss the goal of design and implementation to create a comprehensive web site that met the ATS-PGM web users' needs. We discuss our methodology that enabled the capture of information necessary to create t... View full abstract»

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  • Elevating interface device design in the test program set development process

    Publication Year: 1999, Page(s):253 - 258
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (276 KB)

    This paper describes a Test Program Set (TPS) Interface Device development process which will improve signal performance, lower cost, and enhance maintainability. Hardware is designed as modular components and can be tested prior to incorporation into an interface device. Automated software tools ensure accurate Unit Under Test (UUT) data entry and optimize the use of modular hardware. Once establ... View full abstract»

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  • An agent based measurement laboratory over Internet

    Publication Year: 1999, Page(s):61 - 66
    Cited by:  Papers (15)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (308 KB)

    This paper introduces AgentLab, a distributed laboratory over Internet based on Java and mobile agents. Java ensures portability of measurement software, facilitates interoperability with existing I/O drivers and makes if possible to use mobile agents as the building blocks in-the-large. A measurement test is assembled as a collection of actors plus a runtime support, and is mapped onto a mobile a... View full abstract»

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  • Using built-in-test to reduce TPS run times and improve TPS reliability

    Publication Year: 1999, Page(s):345 - 351
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (376 KB)

    This paper addresses using information derived from Built-in-Test (BIT) to fault diagnose Units Under Test (UUTs), wherever possible. This philosophic approach to diagnostic testing is not new. It has been studied over and over again over the past 20 years under the visor of “Integrated Diagnostics”, but it has yet to be truly implemented in a “real life” military diagnosti... View full abstract»

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  • Cost benefits for the application of COTS ATE

    Publication Year: 1999, Page(s):433 - 438
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (284 KB)

    This paper will discuss the outcomes of a study into the cost effectiveness of using COTS ATE for military equipment programs. An analysis of likely knock-on effects of the technology choice will also be discussed View full abstract»

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  • A multichannel openable-core stage-connection comparator for on-site test of the output current transformers of AC generators

    Publication Year: 1999, Page(s):225 - 228
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (156 KB)

    A multichannel openable-core stage-connection comparator for on-site test of the output current transformers of ac generators is developed. It can be used for on-site test and calibration of the output CT of ac generators when the ac generators are in a state of short-circuit testing. The rated capacities of the comparator are 2500-15000 A and above. Testing of the comparator indicates that ifs ac... View full abstract»

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  • Reusable test executive and test programs methodology and implementation comparison between HP VEE and LabView

    Publication Year: 1999, Page(s):305 - 312
    Cited by:  Papers (4)  |  Patents (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1052 KB)

    The paper outlines the requirements for a reusable test executive and reusable test programs. The concepts of generic test programs and test program sets are introduced then the process of creating test program sets (TPS) from generic test programs, using a TPS editor is described. Various aspects of implementation are compared between HP VEE and NI LabView View full abstract»

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  • Cost and benefit considerations for implementing an open systems approach to integrated diagnostics

    Publication Year: 1999, Page(s):391 - 404
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (900 KB)

    The Department of Defense recently completed a study that recommended an information-based approach to implementing an open architecture for integrating diagnostic functions as a critical and enabling step towards achieving the Department's strategic goals of reducing total ownership cost, shortening cycle time for technology insertion and increasing interoperability of fielded systems. There are,... View full abstract»

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  • A virtual interface bus for portable PCs

    Publication Year: 1999, Page(s):81 - 86
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (440 KB)

    There is a growing demand in the automatic test industry for downsized and portable test systems. As a result, laptop and hand held PCs are now becoming more common in the test arena. However, there is a need to standardize and simplify both hardware and software interfaces between the laptop PC, test equipment, and the unit under test. This paper describes the development of a Virtual Interface B... View full abstract»

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  • O-level tester for A-10 avionics

    Publication Year: 1999, Page(s):457 - 465
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1020 KB)

    An Operational Level Tester was developed to assist in troubleshooting A-10 avionics. The Tester consists of the Portable Automated Test Station and the Operational Test Program (OTP). The OTP provides system level troubleshooting of the Line Replaceable Units connected to the MIL-STD-1553B avionics bus. The OTP software provides the maintainer the capability to perform noninvasive troubleshooting... View full abstract»

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  • Non-destructive on-line sterility testing of long-shelf-life aseptically packaged food products by impedance measurements

    Publication Year: 1999, Page(s):243 - 249
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (508 KB)

    This paper presents the results obtained in the application of the impedance measurement technique for the needs of non-invasive sterility tests. Two pilot food containers have been chosen: (1) Tetra Brik Aseptic (TBA) cartons and (2) Stork Food & Dairy Systems (NL) plastic bodies. The main characteristics of the TBA cartons are-unstable shape, tolerances in size, packaging laminate comprising... View full abstract»

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  • The use of model-based test requirements throughout the product life cycle

    Publication Year: 1999, Page(s):53 - 58
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (332 KB)

    Test requirements, which are generally collected in multiple disparate formats throughout the life cycle of an electronic product, could be used in various applications that reduce test and development cycle times and increase the confidence in the final test program. Unfortunately, test requirements are seldom captured in a consistent format that may be processed by a computer, thus eliminating t... View full abstract»

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  • Soft-error testing of COTS DRAM components

    Publication Year: 1999, Page(s):821 - 827
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (356 KB)

    The paper presents a memory-testing framework wherein an application-driven at rated speed reliability testing is possible for a wide variety of COTS memory components. The susceptibility trend of recent DRAM generations and their impacts at system level are quantified within the proposed testing framework View full abstract»

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  • Robotic probing of conformally coated circuit cards

    Publication Year: 1999, Page(s):337 - 343
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (512 KB)

    In recent years robotics have been utilized in conjunction with diagnostic probing of circuit cards. Traditionally, manual probing is required to isolate component failures. This requires program interruption, use of reference documents and judgment by the operator. It is expected that the operator will locate the proper test point and place the probe with sufficient force to make contact. Often, ... View full abstract»

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  • Vertical test integration

    Publication Year: 1999, Page(s):425 - 430
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (348 KB)

    Today most every weapon system is very electronics intensive. Digital computers are at the core of military aircraft, ship and vehicle weapons systems. Indeed, each weapon system's performance is largely determined by its digital computers and other electronics. This electronics dependency is necessary in order to provide the speed, functional compliance and accuracy to achieve the required weapon... View full abstract»

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  • A laptop based test system [for MIL-STD-1760 interfaces]

    Publication Year: 1999, Page(s):601 - 606
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (296 KB)

    The purpose of this paper is to provide a detailed conceptual description of a laptop based testing system. This laptop tester's purpose is to augment the present, sometimes cumbersome, battery of testers that are used today. The architecture of this design is based on the utilization of COTS devices to keep down the cost as well as to further assure availability of the system components. The tech... View full abstract»

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  • Diagnostic metrics-a critical element of the diagnostic architecture

    Publication Year: 1999, Page(s):215 - 221
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (384 KB)

    Integrated Diagnostics is an iterative process that lives within Systems Engineering but to date there has not been a consistent approach for implementing metrics to monitor diagnostic system enhancements or performance. The DoD has often fielded systems or incorporated “diagnostic enhancements” to systems without having a standardized way for acquisition managers to evaluate or monito... View full abstract»

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  • ATLAS compiler development

    Publication Year: 1999, Page(s):111 - 119
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (532 KB)

    This paper will present methods used in design and development of an ATLAS to C compiler. ATLAS has two major differences from traditional computer languages. ATLAS has an inherent object based organization, many ATLAS language elements are designed around the support of hardware. The other major difference is that programs are frequently written with test station oriented languages embedded withi... View full abstract»

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  • Reconfigurable COTS test systems

    Publication Year: 1999, Page(s):301 - 303
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (168 KB)

    Automatic Test Equipment (ATE) systems are used to qualify, accept, and troubleshoot electronic products. ATE systems may be in the form of large general-purpose systems that can test a wide variety of products or the more commonly used custom, turnkey systems that are designed for specific test application(s) and requirements. Turnkey ATE systems are labor-intensive. As a result, even a relativel... View full abstract»

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  • Specifying an IVI class for digital test instrumentation

    Publication Year: 1999, Page(s):741 - 745
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (240 KB)

    This paper presents an overview of the work being done by Teradyne in conjunction with the IVI Foundation to specify an IVI class for digital instrumentation. The interchangeable Virtual Instruments (IVI) Foundation was formed in August of 1997 to define standard specifications for programming common test instrument capabilities. The paper presents the major architectural aspects of digital test i... View full abstract»

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