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20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07)

6-10 Jan. 2007

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  • 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems - Cover

    Publication Year: 2007, Page(s): c1
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  • 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems - Title

    Publication Year: 2007, Page(s):i - iii
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  • 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems - Copyright

    Publication Year: 2007, Page(s): iv
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  • 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems - Table of contents

    Publication Year: 2007, Page(s):v - xvii
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  • Message from the General Chair

    Publication Year: 2007, Page(s): xviii
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  • Message from the Program Chairs

    Publication Year: 2007
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  • Message from the Organizing Team

    Publication Year: 2007, Page(s): xxii
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  • Conference Committee

    Publication Year: 2007, Page(s): xxiv
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  • Program Committee

    Publication Year: 2007, Page(s): xxvii
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  • Technical Program Committee Members

    Publication Year: 2007, Page(s): xxviii
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  • Steering Committee

    Publication Year: 2007, Page(s): xxix
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  • VLSI Design 2006 Conference Awards

    Publication Year: 2007, Page(s): xxx
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  • list-reviewer

    Publication Year: 2007, Page(s): xxxi
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  • VLSI Design Conference History

    Publication Year: 2007, Page(s): xxxv
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  • Embedded Systems Design Conference History

    Publication Year: 2007, Page(s): xxxvi
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  • P.S. Subramanian: Obituary

    Publication Year: 2007, Page(s): xxxvii
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  • Tutorial T1: Designing Secure SoCs

    Publication Year: 2007, Page(s): 3
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (159 KB) | HTML iconHTML

    Information security is a critical concern in a wide range of embedded computing and communications systems. Embedded systems are being used in critical applications (medical electronics, automotive systems, and avionics), where the consequence of security attacks can be severe. Several business models (e.g., distribution of multimedia content, mobile e- commerce, etc.) require an adequate level o... View full abstract»

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  • Tutorial T2: Organic Electronics: Technology, Devices, Circuits, and Applications

    Publication Year: 2007, Page(s): 4
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (153 KB) | HTML iconHTML

    The field of organic semiconductor based electronics has seen significant and unprecedented progress in the past decade. Low-cost, less energy-intensive and high-throughput production, implementation on flexible and non-planar surfaces, novel applications, as well as the potential to move to more environmentally friendly electronics makes this technology particularly attractive. A wide range of ap... View full abstract»

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  • Tutorial T3: Low Power Design Techniques for Nanometer Design Processes - 65nm and Smaller

    Publication Year: 2007, Page(s): 5
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (151 KB) | HTML iconHTML

    Power has become one of the most important paradigms of design convergence for future microprocessor and ASIC/SOC designs. In this tutorial we present the importance of low power microprocessor/SOC design from the high level microarchitectural, RTL, gate level to transistor level design. We cover the conflicting goals of performance vs low power, routinely faced by designers today. Embedded microp... View full abstract»

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  • Tutorial T4A: Formal Verification Techniques and Tools for Complex Designs

    Publication Year: 2007, Page(s): 6
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (164 KB) | HTML iconHTML

    Integrated circuit technology has evolved from micro-controllers and discrete components to fully integrating a large system on a single chip (SoC). Today, verification is the most expensive component in the design cycle in term of cost and time. This cost is estimated to consume about 70% to 80% of the total design effort. The verification cost is expected to increase for SoC designs. This is mai... View full abstract»

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  • Tutorial T4B: Formal Assertion-Based Verification in Industrial Setting

    Publication Year: 2007, Page(s): 7
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (152 KB) | HTML iconHTML

    Increased complexities of hardware designs have made exhaustive simulation of designs near impossible - thereby creating a need for some complementary verification technique. This has generated a renewed interest in use of formal analysis on industrial hardware designs. Formal analysis of hardware design involves use of mathematical techniques to prove that the design implementation confirms to th... View full abstract»

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  • Tutorial 5: SoC Communication Architectures: Technology, Current Practice, Research, and Trends

    Publication Year: 2007, Page(s): 8
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (153 KB) | HTML iconHTML

    The increasing complexity of systems-on-chip (SoCs) has led to the critical "design productivity gap" problem. Several strategies are being employed to cope with this problem, including an IP-based design flow, as well as platform-based designs for application domains. These approaches have critically increased the amount of on-chip communication. Since on-chip communication architectures have a s... View full abstract»

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  • Tutorial T6: Robust Design of Nanoscale Circuits in the Presence of Process Variations

    Publication Year: 2007, Page(s): 9
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (173 KB) | HTML iconHTML

    The lack of process uniformity in the semiconductor manufacturing has caused variability to become the primary cause of concern for nanometer scale CMOS design. The variations are caused by either global effects such as mask imperfections and lens aberration, or local effects such as layout pattern variations. These variations result in a significant amount of spread in the performance as well as ... View full abstract»

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  • Tutorial T7A: Advanced IC Packaging

    Publication Year: 2007, Page(s): 10
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (135 KB) | HTML iconHTML

    This course will address advanced packaging and assembly technologies. Demands for increased miniaturization and performance of electronic systems have driven traditional IC packaging technologies to higher levels of sophistication and miniaturization. The different styles of IC packages and their evolution will be discussed, from through-hole to surface mount, from leaded to leadless packages and... View full abstract»

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  • Tutorial T7B: RF Analysis and Simulation with Focus on RF SiP Methodology

    Publication Year: 2007, Page(s): 11
    Cited by:  Papers (4)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (169 KB) | HTML iconHTML

    Radio frequency (RF) involves complexities in the circuit design. Non-linearity issues in active as well as passive circuit designs and issues such as parasitic couplings and radiation effects introduce challenges in the RF circuit designs. Besides these, engineers face challenges, such as reduction in design cycle, overall development cost, and the time to market. To address these challenges, RF ... View full abstract»

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