Numerical techniques lead to exact solution of berkeley bipolar model

An automated, process independent SPICE bipolar device modeling system has been developed. The system solves for a complete set of SPICE parameters that when simulated, provide the best mathematical fit to the actual measured performance of the transistor. Automatic computer decisions control all instrument measurements and model extraction procedures, providing consistency between device models, independent of the system operator. With a total measurement and extraction time of less than 30 minutes true statistical process performance may be evaluated.