Complexity analysis of the test generation for interconnection networks

This paper deals with complexity analysis of test generation in the case of interconnection networks. The generated test is under the stuck-at fault model (Feng and Wu, 1981), and the functional fault model (Eleuldj et al, 1988). The algebraic and coloration approaches are presented in order to generate test for these networks. This generation is based on sufficient conditions, which define the U-test, NU-test and M-test.