Full-wave characterization of planar EBG structures by the MoM/BI-RME method

The paper presents a novel method for the the calculation of the dispersion diagram and the phase of the reflection coefficient of planar electromagnetic band-gap (EBG) structures. The MoM/BI-RME (boundary integral-resonant mode expansion) method is adopted in conjunction with a new technique for the efficient calculation of the dispersion diagram. This technique is based on the tracking of the eigenvalue in the complex plane, and proves more reliable than the search of the determinant zeros. The analysis of the classical uniplanar compact EBG structure is presented.