Short-term stability of miniature double oven crystal oscillators using conventional and DHR technology

The present work is devoted to experimental research on the influence of thermal fluctuations in the oven-controlled system on phase noise and short-term stability (STS) of the high stability double-oven crystal oscillators (DOCXO). The paper describes the method of the study and discusses obtained results. The research showed that measured level of STS of the DOCXO (3.0-3.5)/spl middot/10/sup -12/ - is not limited by the thermal noise of the ovens. However, improvement of the STS below (1-2)/spl middot/10/sup -12/ will require minimization of the temperature fluctuations in the double-oven system.