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Characterization of Insertion Loss and Back Reflection in Passive Hybrid Silicon Tapers

Figure 1

Figure 1
(a) Optical mode in passive silicon waveguide. (b) Optical mode in hybrid silicon waveguide.

Figure 2

Figure 2
Two taper types investigated in this paper. Three taper levels are shown: P-InP, top SCH (dark blue), QWs and bottom SCH layer (green), and N-InP, Super Lattice and bonding layers (light blue). The silicon waveguide is shown in gray.

Figure 3

Figure 3
(a) Cutback structures to determine hybrid waveguide loss. (b) Cutback structures to determine taper loss.

Figure 4

Figure 4
Profile of a hybrid silicon mode using (a) a 1.5-Formula$\mu\hbox{m-wide}$ silicon waveguide and (b) a 1.0-Formula$\mu \hbox{m-wide}$ silicon waveguide. (Note the compressed horizontal axis.)

Figure 5

Figure 5
(a) Cutback-on-chip data for hybrid waveguide loss. (b) Cutback data for taper loss.

Figure 6

Figure 6
Back-reflection coefficients at the silicon waveguide/hybrid waveguide interface.

Figure 7

Figure 7
Device used to determine taper reflections. Possible taper-facet cavities and transmission matrices of the individual components are indicated.

Figure 8

Figure 8
Experimental setup used to measure taper reflections.

Figure 9

Figure 9
Transmission spectrum of the Type-1 1.0-Formula$\mu \hbox{m}$ device.

Figure 10

Figure 10
FT of the transmission spectrum of four device and the corresponding fits.