Theoretical and experimental waveguide characterization of small wire scatterers

A simple method is presented in this paper that allows us to verify numerically obtained polarizability tensors of electrically small scatterers by waveguide measurements. To this end, a model of the scattering process within the waveguide is developed. Measurements performed on a small helix in two different waveguide setups are compared to the theoretical data obtained from the model. A good agreement is demonstrated. Furthermore, the measured data are highly sensitive to the orientation of the scatterer within the waveguide. Thus, the polarizability tensors can be verified.