Accelerated life time test methods for new package technologies

This paper describes some life time test methods, equipment and processes for evaluating the most important reliability parameters of new packaging technologies. Another goal of the paper is to introduce some models of the life time acceleration. The most commonly used stresses are: temperature-related accelerated test; temperature cycling; thermal shock, which can be more severe than temperature cycling, as it has very fast ramp rates and shorter cycle times; temperature, humidity and bias (THB, 85/spl deg/C/85%RH); pressure cooker (PCT) and unsaturated pressure cooker test (USPCT); highly accelerated stress test (HAST); some nonaccelerated methods, such as shock, vibration, etc. The paper gives a detailed description of the most effective and economical HAST method.