Resistor matching characterization for process development using D/A converter

In-depth process evaluation and robust device models are essential for integrating analog circuits into logic processes. This work presents a technique for resistor mismatch characterization using a D/A converter test circuit. This design offers a fast, wafer-level test of large resistor arrays representative of converter applications, allowing the designer to evaluate the impact of array area, resistor size, and resistor design on resolution limits. The test methodology is tailored for a production test environment.