EMI Susceptibility of a Digitally Based Analog Amplifier in a 180-nm CMOS Process

This paper investigates and reports the susceptibility to electromagnetic interference (EMI) of a digitally based analog amplifier. The amplifier has been designed in the UMC 180-nm CMOS technology with digital component blocks. Simulations as well as comparative measurements of commercial amplifiers show a superior immunity to EMI of the digitally based amplifier with respect to purely analog topologies.