Down-converted mixer verification using the measured X-parameter for system engineering designers

This paper investigates the down-converted mixer verification using the measured X-parameter in future system-level simulation. The X-parameter measurement system utilizing Agilent's nonlinear vector network analyzer (NVNA) and the external RF signal generator can provide the desired stimulus to device under test (DUT) at the specified port in order to measure and respond to the non-linear DUT characteristic. The X-parameter of the down-converted mixer may include the measured nonlinear output power and phase at the specified frequencies. Also, the down-converted mixer utilizing nonlinear device characteristic to convert RF to intermediate frequency (IF) can be described by the X-parameter with good consistency.