Solution-Processed Logic Gates Based On Nanotube/Polymer Composite

Hysteresis-free logic gates capable of operation at 100 kHz are fabricated basing on local-gate thin-film transistors with their channel featuring solution-processed composite films of single-walled carbon nanotubes (SWCNTs) and poly(9,9-dioctylfluorene-co-bithiophene) (F8T2). Using dip-coating for deposition of composite films, high-density SWCNTs are found to be embedded in an F8T2 layer and thus being kept from the underlying AlO
_x
gate dielectric by a certain distance. The presence of the F8T2 interlayer effectively suppresses hysteresis although it also weakens the gate electrostatic control. The fabricated transistors are characterized by nil hysteresis, high carrier mobility, large ON/OFF current ratio, low operation voltage, small subthreshold swing, and remarkable scalability. These properties are crucial for the realization of the well-performing logic circuits.