Stochastic Analysis of Switched-Capacitor Circuits for Sampled Data Converters

This paper describes an original simulation-based method to derive the stochastic properties of the output noise of switched-capacitor circuits which are used in sampled-data converters. The method relies on a linear time-varying approximation of the large-signal transient response of the switched circuits. It is shown how switched-capacitor-circuit noise and quantization noise, due to the presence of harsh comparators, can be analyzed in a unified frame where the data converter is modeled as a discrete-time system.