Calibration of the weighed sensitive volume model to heavy ion experimental data

The shape of the single event effect (SEE) cross section as a function of the ion's linear energy transfer (LET) can be explained in terms of intra-cell variations of the charge collection efficiency within the cell as opposed the inter-cell spread in the critical charge, as assumed earlier. Free charge carriers generated in areas in absence of electric field but near the depletion region may reach the latter through diffusion processes, then being collected by drift forces in the p-n junction of the semiconductor. In this context, a model of the SV in which different regions are defined through charge collection efficiencies (CCE) is pertinent. A method for calibrating this model to experimental data is proposed, as well as a practical example of how this can be done. A crucial aspect of this technique is that, as will be shown, the experimental cross section curve can be recovered through Monte Carlo simulations of a single RPP as opposed to the Heaviside step function obtained when using a standard single sensitive volume approach.