Broadband measurements of nanofiber devices: Repeatability and random error analysis

On-wafer, broadband measurements of two-port nanofiber devices were made in order to test the short-term repeatability of a widely used measurement approach that builds on established on-wafer calibration techniques. The test devices used in this study consist of Pt nanowire and Au microbridge structures incorporated into two-port coplanar waveguides. Based on repeated measurements of these test structures, we computed statistical (Type A) uncertainties. The standard deviation (k=1) of five repeated measurements of a Pt nanowire device was less than 50 μS. The analysis suggests refinements to the measurement process depending on the desired output of the measurements, e.g. the broadband response itself or the extraction of circuit model parameters.