Generating higher output power signals for today's test applications

High test signal power provides multiple advantages within the RF test environment. It can mean greater accuracy of measurements and the ability to evaluate devices over a larger dynamic range. This in turn results in a wider breadth of capability from the test system ensuring coverage of the boundary conditions that may affect system readiness. Long cable runs and switch matrices that consume signal power before the test signal gets to the device under test aggravate the problem. As a simple example, when testing a high power microwave amplifier like a Traveling Wave Tube (TWT) to be installed in a radar system, high input level is needed to evaluate the unit over the entire linear range. This needed input level is often greater than 25 dBm. If the source input level is limited to evaluating the unit over just this range, the results of rare scenarios where the unit is overdriven are never characterized. This paper first explores the RF applications and measurements that benefit from a stimulus of high power signals. It will demonstrate methods by which higher RF power can be used to improve test coverage and measurement accuracy. Secondly, the paper will educate the test system designer how to incorporate and use high power stimulus in their test environment.