Support Vector Regression for Measuring Electromagnetic Parameters of Magnetic Thin-Film Materials

We propose a novel method for extracting the electromagnetic parameters (complex permittivity and permeability) of magnetic thin-film materials. The method extracts electromagnetic parameters of the magnetic thin films from effective electromagnetic parameters by using the supported vector machine (SVM). We validated the method in the frequency range of 1-8 GHz. The results show that the errors for both epsiv' and mu' are less than 0.5%, and the errors of both tan delta
_epsiv
and tan delta
_mu
are less than 0.001.