A Compact System for Systematic Noise Measurement of Schottky Diodes for THz Applications

As Schottky diodes still remain the most frequently used devices in THz mixers, precise evaluation of their DC and noise performance is essential for the improvement of mixers in the sub-millimeter wave regime. We present first results from a measurement system which is able to measure the DC characteristics and the noise for Schottky diodes as a function of frequency and bias current. The automated system is capable of contacting many diodes consecutively.