Analysis of Multigrid Frequency Selective Surfaces by the MoM/BI-RME Method and the Segmentation Technique

This paper presents a novel method for the analysis of frequency selective surfaces (FSSs), consisting of one or more thick metal screens perforated periodically with arbitrarily shaped apertures. Basically, this method applies the segmentation technique, thus reducing the computational effort to the analysis and the combination of a number of waveguide step discontinuities. The analysis of the waveguide step discontinuities is performed by the MoM/BI-RME method. Some examples are reported and compared with experimental data.