Base-band impedance control and calibration for on-wafer linearity measurements

This paper introduces a direct and accurate method for controlling and measuring the on-wafer device terminations at the base-hand / envelope frequency, using an extension of a conventional network analyzer setup. The base-hand impedance can he adjusted manually as well as electronically and is able to (over)compensate the losses in the measurement setup. This facilitates on-wafer base-hand terminations ranging from negative tu high Ohmic values. The proposed measurement techniques are particularly useful when characterizing active devices for their linearity