BESOI-based integrated optical silicon accelerometer

The design, simulation, fabrication and characterization of a new integrated optical accelerometer is presented in this paper. The reduction of fabrication, packaging and thermomechanical stresses are considered by keeping the weak mechanical parts free of stresses. The mechanical sensor consists on a quad beam structure with one single mass. In addition, there are two waveguides on the frame of the chip self-aligned to one on the mass of the accelerometer. Four lateral beams increase the mechanical sensitivity and allow the flat displacement of the optical waveguides on the mass. The working principle is based on the variation of the output light intensity versus the acceleration due to the misalignment of the waveguides. The devices have been optimized by the finite-element method to obtain a mechanical sensitivity of 1 /spl mu/m/g. The fabrication technology is based on BESOI wafers combining bulk an surface micromachining. Moreover, machined glass wafers with cavities are bonded to the silicon wafer for packaging and damping control. Special packaging considerations as dicing, polishing and alignment are also presented. Optical measurements at 633 nm shown an optical sensitivity of 2.3 dB/g for negative and 1.7 dB/g for positive acceleration. This difference in the sensitivity has been demonstrated as a consequence of the passivation layer located over the core of the waveguides.