Noise Influence on Operation of Capacitive Sensor Analog Readout Circuit in Simulation versus Measurement Comparison

The paper presents simulation-based analysis of noise presence in the analog readout circuit in relation to measurements of the fabricated circuit specimen. Excessive noise may degrade circuit performance by reducing the quality of its output signal. Simulations performed before design fabrication can improve circuit operation quality. Improvement may be reduced by limited precision of noise properties built into technology device models. Comparison of simulation and measurement results is presented and obtained results are discussed regarding noise-related parameters of the tested analog readout circuit.