Next Generation Test Library for RF SOC on ATE

Current RF SOC devices are highly complex with many modules with different functions and wireless standards. This complexity results in thousands of tests needed even for production testing. Characterization and engineering test flow will demand even more tests. It takes a lot of time to develop, debug and bring the program into production. This is especially true for new engineers which can take months or years to develop on their own. Typical solution would be to develop a test library to generate all the tests. However, not all test library are build the same. And typical” 1st generation” are done to get the job done. They can be difficult to debug and may need hack codes for special or customized test. In addition, some libraries have grown so complex that it takes a long time to learn how to use them. With experiences gained from development of many projects and Java coding, a new better next generation test library was developed. This paper described a new improved version of such a test library which provides more features & benefits, more user friendly and easy to learn. The paper first describes the need for test library and typical issues with existing test libraries. The benefits and new features of the next generation test library will be introduced. The structure and use model of this user-friendly RF SOC test library will be described. How and why development time and cost will be reduced. Complicated hacking codes can be eliminated. Future-proofing the library, it is designed to allow new wireless standards and tests to be added. Debugging and setup features will also be described. Efficient and ease of importing user input, registers setup and design pattern will help even new users create test program efficiently and quickly. This library is also designed to ease learning curve when using it. A beginner can develop a new kind of RF SOC offline program within one month. Framework to allow easy usage allows users to stay at a higher level helps them to focus on test strategies.