Effects of Surface Treatments on the Performance of CdZnTeSe Radiation Detectors

In the present study, I-V curves and EFM-Phase measurement for surface polishing treatments are used in order to obtain electrical properties like breakdown voltages, leakage currents and Schottky Diode Barrier Height (SBH) calculated by Thermionic Emission model (TE) and parabolic model of EFM-Phase. The results showed that a polishing treatment with 0.03 μm grain size alumina powder solution induces a higher SBH, lower leakage current and higher breakdown voltage compared to that with 1 μm alumina solution.