Applications of the Miniaturized Probes in the Near-Field Measurements of RF Integrated Modules

In this paper, the work focuses on the near-field measurements of RF integrated modules using miniaturized probes. Compared with board-level circuit and integrated circuit chip, integrated system has large-size and complex structure. Therefore, a test system is proposed in the work. The test system consists of a personal computer (PC), motion controller, power amplifier module, three-axes mechanical arms, and spectrum analyzer. The three-axes mechanical arms is used to move the probes to perform the near-field measurements.