Proton-Induced Output Clock SEU and SEFI Characterization of the ADC12D1620 12-Bit Analog-to-Digital Converter

Proton-induced SEE results are reported for the ADC12D1620. Output clock SEU cross sections were measured over a range of proton energies. No SEFI events were observed at 250 MeV to a fluence of 2.0×10
¹¹
p/cm
²
.