Inverted Polymer Solar Cells Using V2O5/NiO as anode selective contact: Degradation Study

In this work, we analyze the stability and degradation over time of inverted organic solar cells (iOSCs) using a stack layer of vanadium oxide and nickel oxide as hole transport layers (HTL). The parameter used to compare with other cells is the power conversion efficiency (PCE). Vanadium oxide layer (V
₂
O
₅
) used as HTL is the reference in this work which is monitored the stability and degradation. All devices are fabricated under nitrogen environment. The stack layer thickness used as HTL is fabricated with NiO on V
₂
O
₅
layer, which has been varied. The photovoltaic devices are encapsulated to be studied their degradation over time following the ISOS-D1 protocols during 10200 h. The active layer for devices is a mix of PTB7-Th and PC70BM being the donor and acceptor material, respectively. The performance parameters under light during the degradation process are extracted from the current density - voltage (J-V) characteristics. The PCE of iOSCs manufactured with the stack V
₂
O
₅
/ NiO (0.5 nm), V
₂
O
₅
/NiO(1 nm) and V
₂
O
₅
/NiO(0 nm) reached the 80% (T
_S80
) after 1600 h, 190 h and 84 h, respectively.