An Optimization Technique for Deriving Dielectric Characterization of Microwave Substrates

This work presents a method of deriving material properties based on coplanar waveguide configuration with a very simple structure (straight lines), and this method can quickly determine the substrate dielectric characterization. The widely used FR4 substrate is applied to verify our method. The error of the derived dielectric constant and dielectric loss tangent is as small as 0.45% (4.38 vs 4.4) and 7.5% (0.0185 vs 0.02) at 4-10 GHz range, respectively.