A Storage Reliability Evaluation Method of Plastic Package EEPROM Based on ADT And Physical Analysis

Storage reliability estimation is critical to the electronic product in military field. EEPROM is a type of read-only memory that is widely used in some military device, but its storage failure mechanism is not considered deeply. This paper attempts to demonstrate an efficient method to predict storage reliability of EEPROM. Failure mode and failure mechanism of the plastic package EEPROM with MOS structure is given. Then the Accelerated Degradation Test (ADT) of EEPROM is designed and taken. The electrical performance is monitored over time. The degradation data are collected and modeled, which is used to predict the storage reliability at normal condition. Finally, the method of physical analysis based on non-destructive Scanning Acoustic Microscope (SAM) is employed to analyze the physical-chemical process in the Accelerated Degradation Test.