Research Conductivity Ranges of Recrystallized Layers for Telluride Cadmium

The article is focused at analyzing the study of the reviewed amorphous chalcogenide thermal properties and studying the recrystallized layer photoconductivity spectra for cadmium telluride of various types. Sintered CdTe layers were obtained by spraying the aqueous suspension onto a heated ceramic substrate. The obtained structure parameters were determined at 300 K. The analysis of the photocurrent graphical dependences on obtained material temperature in the range of T>300 K is carried out. The spectral photoconductivity distribution functions of the studied samples in the wavelength range of 0.3÷0.9 μm were analyzed. It has been established that an increase in the surface recombination center concentrations is related to oxygen adsorption.