The Research of Bulk Current Injection Probe Used for ICs Electromagnetic Immunity Measurement

In this paper, the electromagnetic modeling of bulk current injection (BCI) probe is used to analyze the influence of coil factors. In order to analyze the high frequency performance of the probe, the lumped circuit modeling of BCI probe is used to analyze the influence of parasitic capacity. The matching components are used to eliminate high frequency resonance. As a consequence, the results above allow for designing BCI probe with smooth flatness and small insertion loss.