Destructive Testing of Electronic Components Based on Absorption Cross Section RC Measurements

We present a destructive testing procedure based on absorption cross section (ACS) measurements defined by the recorded power in a reverberation chamber (RC). Destructive testing of light-emitting diodes (LED) are performed at frequencies with maximum absorption cross section ratio (ACSR) and at frequencies with lower ACSR. The failure outcome scales with the expected maximum value distribution as a function of the number of uncorrelated samples in the RC. The required power to break the diodes at lower ACSR is consistent with the theory. The statistical distribution of the composite ACSR is modelled with a generalized beta prime distribution.