Susceptibility characterization of beam pipe radiated noise for the PXD detector in Belle II experiment

The new Pixel Vertex Detector (PXD) used in the upgrade of the high energy physics experiment Belle II is based on the DEPFET technology. Since the PXD is 2 mm far from the beam pipe, the effects of radiated interferences may be taken into account. Though the EM wave associated to the beam is very well confined (skin depth), the beam pipe is grounded to the accelerator and it may have noise currents on its external face due to pumps, auxiliary electronics, power converters, etc. which may produce radiated noise (H field). This analysis is part of the EMC approach that covers the analysis of the emissions and immunity characteristics, as well as the coupling phenomena and grounding issues to define the susceptibility levels required to ensure the successful integration of the detector and, specifically, to achieve the designed performance of the front-end electronics.