The GSG-PAD Layout Optimization for Test-Key of mm-Wave Devices

In this paper, a layout optimization of GSG-pad structures for mm-wave devices testing is studied. We find that the parasitic of GSG-pad is strongly related to the area and shape of the pad and the connecting parts between GSG-pad and DUT. The different parasitic with different layout has great influence on the accuracy of the DUT's characteristics after de-embedding. For different type of DUTs, the best measurement accuracy can be obtained by optimizing the GSG-pad layout to reduce the parasitic factors of the pad that has the greatest impact on device key performance. The layout optimization of GSG pads has been discussed for different types of DUTs.