Nanoscale Variations in Halide Perovskite Structure and Stability: Insights via Nano-Diffraction

In this study, we use nanoprobe X-ray diffraction to measure structural variations in thin halide perovskite single crystals including mosaicity, tilt and strain. Using X-ray diffraction at 100-nm spatial resolution offers high sensitivity to structural variations within thin film materials. Here, we examine the crystal structural changes under X-ray irradiation toward understanding in detail the determining factors in this process including chemistry of materials, dose, and dose rate.