Approach for a Holistic Optimization from Wafer to PV System

Models for the calculation of losses in PV systems are widely applied but typically focus on single components (i.e., the solar cell). We discuss relevant models and combinations thereof to analyze losses from wafer to system. We propose a holistic approach to analyze losses from laboratory to environmental conditions. The proposed approach focusses on practically relevant interfaces (i.e., STC module power) and is based on separated influence factors.