Defect Prediction Approach to enhance Static Fault Localization of Functional Logic Failure Defects using NIR Photon Emission Microscopy

Studies on defect induced emission characteristics have significantly enhanced the effectiveness of static fault localization on functional logic failures due to open and short defects. In this paper, using the distinctive differences in the defect-induced emission characteristic between open and short defects, together with layout trace and analysis, a defect prediction approach has been derived. It assisted in the hypothesis of the defect type, narrowing down the defect location within long failure net(s) and even pin-pointing the exact defect location in some cases. Successful case studies on advanced technology node devices were used to describe four different emission signatures of open and short defects and the effective application of aforementioned approach in isolating the defect.