A statistical equivalent circuit modelling based on measured and de-embedded S-parameters

In this paper, a statistical equivalent circuit model of a chip monolithic ceramic capacitor is analyzed based on the measured and de-embedded S parameters. By optimizing the model parameters in the equivalent model, the deviation introduced by the measurement and the de-embedding process are alleviated. Through analyzing the equivalent model of 1pF and 2pF capacitor, the model of a 1.5pF capacitor is calculated and verified by the measurement results.