ICIM-CPI: Integrated circuits immunity model: Conducted pulse immunity: Description, extraction and example

The Integrated circuits immunity model-Conducted pulse immunity (ICIM-CPI) has been developed to allow the simulation of the conducted transient immunity of an Integrated Circuit (IC) to pulses such as Electrostatic discharge (ESD) and Electric fast transient (EFT). The model, in its current form, addresses voltage breakdown and thermal breakdown failures. The model is intended to be used for predicting the immunity levels to conducted pulses disturbances applied on IC pins. It is intended to be used for predicting the immunity level, both damage and function failure, to conducted pulses disturbances applied on IC pins.