Application of an enhanced failure bitmap method for memory fault isolation

This paper is to describe an enhanced failure bitmap analysis method which can significantly improve the hit rate on memory cell fault isolation than conventional failure bitmap method. In this method, during bitmap test analysis, a critical parameter is enhanced by corresponding setting, to make the difference between faulty memory cell and non-faulty memory cell large enough to be recognized and then be represented by failure bitmap. This paper presents the methodology and several typical application cases.